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LuQY Pro
Absolute luminescence analysis
PLQY, ELQY & QFLS - in seconds
LuQY Pro is a compact, fully integrated system for absolute photo- and electroluminescence analysis of thin films, layer stacks and complete optoelectronic devices. It measures PLQY and ELQY and directly determines the quasi-Fermi level splitting (QFLS / iVoc) under controlled optical and electrical operating conditions. Automated measurement and analysis deliver reliable results within seconds.
Overview
About LuQY Pro
LuQY Pro is an integrated measurement system for the characterization of luminescent materials and optoelectronic devices. It combines optical excitation, electrical control, absolute light collection and spectral analysis in a single instrument.
The system measures photoluminescence quantum yield (PLQY) and electroluminescence quantum yield (ELQY). From the measured emission data, it also determines the quasi-Fermi level splitting, commonly expressed as QFLS or implied open-circuit voltage (iVOC).
During a measurement, the sample is excited optically by a controlled laser source or electrically through the integrated source measure unit. The emitted light is collected by an integrating sphere and analyzed by a spectrometer. All relevant optical and electrical signals are recorded and processed automatically by the LuQY Control software.
The complete workflow covers motorised excitation control, data acquisition, automated calculations and integrated analysis. It is designed to minimize manual steps and reduce measurement variability. Standard measurements can be completed within seconds, while measurement parameters remain fully accessible for more detailed investigations.
LuQY Pro can be used with thin films, multilayer stacks and complete devices. Its integrated design makes it suitable both for routine characterization and for more advanced experimental workflows where controlled and reproducible operating conditions are required.
LuQY Pro
LuQY Pro in Operation
Measurement to Data: Automating your workflow
Database Integration
Store results directly in your existing database infrastructure.
API Integration
Connect instrument control and data acquisition to custom software and automated laboratory workflows.
View API DocumentationResearch Data Platforms
Connect results to QYB Lab or NOMAD Oasis for structured data management and research workflows.
Factory Calibrated
Complete optical unit calibrated with a NIST-traceable reference source.
Verified Before Delivery
Every system is tested and commissioned by QYB.
Research-Based Methods
Measurement and analysis methods supported by peer-reviewed scientific literature.
Reliable Results, Built on Verified Performance
Every LuQY Pro is individually tested and calibrated by QYB before delivery. The integrating sphere and spectrometer are calibrated as a complete measurement unit using a NIST-traceable reference source to support consistent and reproducible absolute measurements.
The system is designed in accordance with applicable European electrical, electromagnetic compatibility and laser safety requirements.
LuQY Pro is built on measurement and analysis methods established through fundamental scientific research and peer-reviewed literature. Today, the system is used by specialists across the world to investigate photovoltaic and optoelectronic materials, identify recombination losses and support the development of advanced devices.
Specifications
| Parameter | Specification |
|---|---|
| Measurement | |
| Measurement modes | Absolute photoluminescence and electroluminescence |
| Calculated results | PLQY, ELQY, QFLS / iVOC |
| Minimum resolvable luminescence quantum yield | 10⁻⁶ (0.0001%) |
| Spectrometer integration time | 1 ms–35 min |
| Spectral sampling interval | 1 nm |
| Signal-to-noise ratio | 600:1 |
| Optical excitation | |
| Excitation wavelength | |
| Compatible spectral detection range | 450–1050 nm |
| Photoexcitation intensity | 0.0001–10 suns, continuously adjustableThe achievable equivalent-sun intensity may depend on the sample absorption, band gap and selected spot size. |
| Excitation spot size | 0.1 cm² / 1 cm², selectable |
| Electrical system | |
| Integrated source and measure unit | Yes |
| SMU maximum ratings | ±10 V, ±150 mA |
| Voltage source accuracy | 10 mV |
| Voltage sensing precision | 50 µV |
| Current sensing precision | 100 nA / 1 µA / 10 µA, depending on the selected range |
| Contactable subcells | Up to 6 via integrated relay box |
| Sample handling | |
| Maximum sample dimensions | 30 × 30 mm |
| Sample holder | Customizable |
| Excitation spot selection | Motorized switching between 0.1 cm² and 1 cm² |
| System | |
| Dimensions (W × D × H) | 220 × 390 × 130 mm |
| Weight | 6.1 kg |
| Computer connection | USB 3.0 |
| Power connection | DC |
| Calibration | |
| Excitation calibration | Calibrated against certified reference solar cells |
| Spectral calibration | NIST-traceable reference source |
| Recommended calibration interval | 1 year |
Applications · LuQY Pro
From process control to detailed loss analysis.
Quality Assessment
Quality assessment for rapid process control after each fabrication step or for accelerated material and process parameter screenings.
Transient Effects
Fast acquisition resolves shifts in emission spectrum and intensity, as well as EL / PLQY and QFLS, on timescales from 10 ms to several hours.
Resolve Bulk & Interface Recombination
Quantifying bulk and interface recombination losses in semiconductor thin films, layer stacks or complete devices such as solar cells or LEDs. Examples in academic publications can be found in [1–6].
Efficiency Potentials & Loss Mechanisms
In-depth analysis of efficiency potentials and loss mechanisms in semiconductor thin films, layer stacks or complete devices, for example by determining ideality factors and pseudo-JV curves from intensity- and/or bias-voltage-dependent EL / PLQY and iVOC. See also [7–9].
Scientific references
References behind the applications.
Recombination analysis
Resolving bulk and interface recombination losses from PLQY and absolute PL
- [1]Unold et al., Advanced Characterization Techniques for Thin Film Solar Cells, Chapter 7: Photoluminescence Analysis of Thin-Film Solar Cells, Wiley, 2011, ISBN: 9783527410033QYB team contribution
- [2]Al-Ashouri et al., Energy Environ. Sci., 2019, 12, 3356–3369QYB team contribution
- [3]Kegelmann et al., ACS Appl. Mater. Interfaces, 2019, 11, 9, 9172–9181QYB team contribution
- [4]Stolterfoht et al., Energy Environ. Sci., 2019, 12, 2778–2788QYB team contribution
- [5]Liu et al., ACS Energy Lett., 2019, 4, 1, 110–117QYB team contribution
- [6]Kirchartz et al., Adv. Energy Mater., 2020, Early View 1904134QYB team contribution
Efficiency analysis
Ideality factor and pseudo-JV curves from light-intensity dependent absolute PL
Downloads
LuQY Pro brochure
Download brochureLuQY Pro in research
Actively used in peer-reviewed science.
Researchers worldwide use LuQY Pro to investigate photovoltaic and optoelectronic materials, quantify recombination losses and support advanced device development.
Explore peer-reviewed research